Scalable support of digital, mixed-signal and RF devices, Ideal for wireless, WLCSP, MPU and GPU devices; Maximum test resource utilization for greatest return on capital investment, Test head in direct contact with probe card, High-performance signal integrity for functional test at wafer stage, High parallelism and throughput to lower cost of test, Contact force up to 300KG with superior planarity, Excellent contact quality for large die and high pin count devices, All per-pin DC resources leading maximum parallelism, Per-pin TMU addressing the pervasive use of local PLL-based time domain synthesis avoiding no special resources and routing, Per-pin sequencing enabling flexible I/O port assignments and concurrent execution of multi domain functions, Versatility and scalability of power supply sources to100's of mili-amps with per resource integrated measurement capability, Flexible vector memory architecture and licensing options enabling a broad mix of deep scan to high speed functional assignment, Leading edge performance cards augment the offering of general purpose capability all the way up the 12.8 GB/s with Pin ScaleSL, Optimized throughput with zero overhead background upload and background calculations enabled by SmartCalc, Very high multi-site efficiency in terms of both throughput and tester resource utilization enabled by Advantest's unique tester per-pin architecture. Very high speed I/O technology, SerDes based (such as PCIe, HDMI.. ) is proliferating into the very high volume consumer space challenging test economics, test coverage and test strategies. Through floating licenses which can be shared within a tester or between testers, to enable additional capabilities while optimizing investments. 0000009007 00000 n
Provides real-time features such as decimation and averaging to enable faster test times and improved dynamic performance Offers an analog bandwidth of up to 800 MHz DIGHB is supported on PAx and Diamondx Instruments by Name DIGHB - Hummingbird Digitizer DragonRF - Industry leading RF source and receive with scalar and vector measure Click on more information for further details. Semiconductor test equipment supplier Advantest has introduced the newest generation of its Wave Scale RF channel cards for the V93000 platform to address the growing market demand for Wi-Fi 6E, 5G-NR transceivers, LTE-Advanced Pro and IoT communication devices operating at frequencies up to 8GHz. : Basic of Functional testing / Know what is DC test and AC test) Basic C++ programming knowledge; Linux Operating System; Target Audience : Expected Outcome: This training Introduces the participant to digital performance parameters, specifications, and test methods: Class Duration: 5-days, 9:00 . This class introduces the V93000 SOC Series (using Smart Scale cards). E-mail Admin : saprjo@yahoo.com. Seamless integration with the design tools, full automation of the design to test and test back to design flow and process are key to success. Floating VI Source for High Power Applications. 0000058497 00000 n
The cards advanced architectures allow for highly parallel testing of multiple communication standards or multiple paths within each device, resulting in high multi-site efficiency and a much lower cost of test. Requires myAdvantest login and corresponding privileges. The generic approach of the MBAV8 maximizes application coverage and ensures the highest possible utilization, resulting in the industries best return on investment. Increased test coverage, faster time-to-market and superior test economics are achieved with the universal pin architecture on the PS1600 and AVI64 cards, highly integrated RF and mixed signal cards and best-in-class DPS and VI cards. All card types fit in all test heads, which provide the same power, cooling and computer interfacing to each card, independent of tester size. Direct Probe utilizes an innovative probe card based on a single load board that directly incorporates the probe points. Direct Probe is mechanically designed and engineered for contact force management and with the planarity to support large surfaces and high pin counts at wafer test. High density DPS for massive multi-site applications - extending the power supply versatility of the V93000. 0000176239 00000 n
With the majority of the functionality tightly integrated into the system's test head, the platform offers superior speed, performance analog as well as the lowest noise floor. Designed for highly parallel multi-site and in-site parallel testing, the new #V93000 Wave Scale RF and V93000 Wave Scale MX cards substantially reduce the cost of test and time to market for today's RF #semiconductors while creating a path for testing future 5G devices.The new cards target the RF and wireless communication market segments by providing highly efficient test solutions for the semiconductors that drive LTE, LTE-Advanced and LTE-A Pro smartphones as well as LTE-M, WLAN, GPS, ZigBee, Bluetooth and #IoT applications. Click on more information for further details. The intent is to provide the skills required to utilize the V93000 tester platform as an integral tool in the engineering and production flows of semiconductor device manufacturing. Advantest Corporation
Click on more information for further details. View and Download Advantest instruction manual online. Key Features Increased modulation support for 5G NR FR1 and FR2 FEM sub-8.5 GHz Immediate Wi-Fi 6/6E/7 including 7.126 GHz band Building blocks for 5G NR FR2 mmWave 23.45 - 48.5 GHz Configurable with up to 32 Universal RF ports Up to 8.5 GHz RF modulated source and 8.5 GHz RF measure Noise source available on all ports Click on more information for further details. While other systems test one RF standard per site at a time, this card enables simultaneous testing of multiple standards or multiple paths within each DUT. Very high speed I/O technology, SerDes based (such as PCIe, USB, HDMI.. ) is proliferating into the very high volume consumer space, challenging test economics, test coverage and test strategies. 0000237580 00000 n
Operating Manual of Discontinued Products, Q84501/Q84502/Q84503/Q84505/Q84506/ Q84521/Q84522, Q84601/Q84606/Q84605/Q84605P/Q84621/Q84621A (English/Japanese), R3752/R3753/R3764/R3765/R3766/R3767 Series Programming Guide, R3752H/R3753H/R3754 Series Programming Manual, R3754A/R3754B User Manual (Product Overview), R3754A/R3754B User Manual (Functional Descriptions), R3764/R3765/R3766/R3767 Programming Manual, R3764H/R3765H/R3766H/R3767H/R3765G/R3767G Series Programming Manual, R3752H/R3753H/R3764H/R3765H/R3766H/R3767H/R3765G/R3767G/R3754 Series Programming Guide, TR14501A/B and TR4172/TR4173 Connection Manuals. The size of the Performance Board is Small and Large, both of which can be connected to all classes of testers. Automation Solutions Because of its high integration and decentralized resources, the Advantest V93000 SoC Series offers unprecedented scalability and control. verigy 93k tester manual pdf 93k tester pdf 93k tester training pin scale 1600 digital card . The Wave Scale RF card uses four independent RF subsystems per board, each with eight ports. With higher quality signals, the control and performance needed for accurate stimulation and full functional testing of digital, mixed-signal and RF devices directly on the wafer is possible. Full test processor control ensures time synchronization between all card types, like digital, Power, RF, mixed signal and so on. Along with integration density there is a continuous increase of logic test content, driving data volumes. Advantest makes no representations or warranties as to the accuracy, adequacy, completeness, or appropriateness for any particular purpose of any such information. The benchmar RF Test Solution for 4G and Beyond Productivity Designed to deliver high performance RF test capability for the complete spectrum of connectivity and mobility standards while offering new levels of manufacturing test efficiencies Extensive suite of new capabilities designed to provide the lowest cost of Its modular design makes it easy to extend the system with new modules and instrumentation, as your test needs change. With the majority of the functionality tightly integrated into the system's test head, the platform offers superior speed, performance analogas well as the lowest noise floor. Per pin capabilities such as individual clock domain, high accuracy DC and industry-leading digital performance are expanded with the Pin Scale 1600. The user benefits are reduced test time, best repeatability and simplified program creation. ADVANTESTs Wave Scale generation of channel cards for the V93000 platform enable highly parallel multi-site and in-site testing that dramatically reduces the cost of test and ultimately the time to market for current and future devices. Founded in Tokyo in 1954, Advantest is a global company with facilities around the world and an international commitment to sustainable practices and social responsibility. The operation area is further expanded by multiple 20-bit high resolution AWGs, floating high current units as well as differential voltmeters, all accessible at every instrument channel. As the figure shows, the combined solution consists of an Advantest V93000 tester and twinning test head extension from Advantest, to which MultiLane adds power, cooling and a backplane to create the HSIO card cage. 0000059227 00000 n
Floating licenses which can be shared within a tester or between testers, enable additional capabilities like more speed and more memory while optimizing investments. Verigy V93000 Pin Scale 1600 VelocityCAE. V93000 SmarTest System Software Downloads, Scalable support of digital, mixed-signal and RF devices, Ideal for wireless, WLCSP, MPU and GPU devices; Maximum test resource utilization for greatest return on capital investment, Test head in direct contact with probe card, High-performance signal integrity for functional test at wafer stage, High parallelism and throughput to lower cost of test, Contact force up to 400KG with superior planarity, Excellent contact quality for large die and high pin count devices. Advantest Introduces Evolutionary V93000 EXA Scale SoC Test System targeted at advanced digital ICs up to the exascale performance class. Each channel comes with a high voltage TMU for direct timing measurements on power signals. The new cards can handle today's market requirements and also projected technology changes for #5G networks. | Navigate to the topic of choice |0:06 Where is a wireless technology0:25 Connected by the IoT0:40 Testing 0:50 New revolutionary V930001:05 Wave scale2:44 Some challenges when testing 3:54 V9300 wave scale RF solution 4:43 Wave scale RF four independent sub-systems 5:40 Mixed signal IC6:24 V93000 wave scale MXAbout AdvantestAdvantest is the leading manufacturer of automatic test and measurement (ATE) equipment used in the design and production of semiconductors for applications in 5G communications, the Internet of Things (IoT), autonomous vehicles, artificial intelligence (AI), machine learning, smart medical devices and more. EVA100 Advantest Introduces New Module, Extending EVA100 Measurement System's Capabilities to Include High-Voltage Semiconductors AirLogger The scalable design is a key capability to enable outstanding device portfolio coverage and test cost advantages in one single test platform. The single load board can leverage existing final test designs and can be shared between wafer probe and final test, reducing hardware development time and hardware cost. 0000008392 00000 n
The V93000 digital test solutions are based upon Advantest's proven per-pin architecture, enabling a broad variety of capabilities for the core digital test cases. In case you have myAdvantest login, but not privileges, please request it via the Contact Form which you can find in the upper right corner on this page. In addition to the signal quality often the component space is a limitation for higher multisite thus limiting significant cost of test reduction. 0000033254 00000 n
Its leading-edge systems and products are integrated into the most advanced semiconductor production lines in the world. With high density cards, universal features and precision force and measurement capabilities the PAC solution enables leading CoT savings at high site count testing. The platform has become the all purpose reference platform. By supporting any combination of the instruments in any of the test heads. Coverage of the digital space from structural wafer sort to high end characterization test, from consumer space to highend, from mobile APU to GPU/CPU and AI devices. Advantests V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. Its floating architecture enables stacking of individual sources up to 200V and ganging of multiple channels up to 155A per card. A few months experience in testing digital ICs with the V93000 SOC test system; Familiarity with the programming language C++; Familiarity with analog and digital conversion circuits and their characteristics; Outcome: Understand how to make test plan develop test programs for mixed-signal devices You will know the how to: Whether you need to address very high pin counts, address a high degree of parallelism and multisite efficiency, address large scan data volumes, support sophisticated power delivery or explore very high speeds or timing accuracy, the V93000 provides solutions across the entire space in one go. Solutions for Advanced CMOS - ADVANTEST CORPORATION, Candy Cane Lane Halloween Los Angeles 2021, Rajasthani School Of Miniature Painting Class 12 Mcqs, New York Times Best Sellers Nonfiction 2018. TSE: 6857. 0000006781 00000 n
Each pin can run with its own clock domain to match the exact data rate requirements of the device under test, providing full test coverage. The current industry standard for wafer prober interface (Pogo Tower) degrades the signal quality because the signal must pass through multiple transition points and a distance of 4 to 5 inches. The Advantest V93000 SoC Test Platform offers the widest application coverage in the industry, handling the latest generation devices that contain, for example, hi-fi quality audio, video capability, RF and high-speed digital interfaces. With it's breakthrough Direct Probe probe card interface technology the V93000 offers 4 times the component space on the probe card with optimal signal integrity to allow known good die testing with higher multisite already at probe. 0000012048 00000 n
The V93000 Port Scale RF architecture makes key contributions in several dimensions: WLCSP require test coverage of final test at probe to enable known good die testing. New technologies consistently come with new fail mechanisms, such that advanced silicon debug becomes an integral necessity in the race to market. ml`)>/d(2Z,KmZ&k)T\c,\h3M/(?Yb+4YhIV5Yhs~q 0000001756 00000 n
The J750Ex-HD is the most mature and market proven platform for automotive MCU test. 0000015761 00000 n
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JRWz fz&pTP ML>"CgT; HH~H>EHy Advantest's Direct Probe reduces the length and number of signal-path connections between tester pin electronics and probe points, significantly improving signal integrity for device testing. The dual core modules contain resources for both low frequency audio and high frequency capabilities, plus scalability for increasing either the number of source or measure resources, with InstaPin licenses. The result: excellent mechanical and electrical contact is assured. Combined with the high density DUT power supply DPS128 the solution offers highly parallel test capability for MCUs with embedded analog cores as well as SmartCards and NFC controllers. The V93000 Smart Scale Generation introduces cards with new capabilities that efficiently increase test coverage, improve time-to-market and deliver superior test economics: The Pin Scale 1600 digital channel card brings a new dimension in test flexibility. The PowerMUX card offers a "sea of switches" for individual usage in typical power applications. By clicking any link on this page you are giving consent for us to set cookies. testing of symmetrical high-speed interfaces and enhanced SmarTest software functionality. The cards innovative architecture allows simultaneous and fully independent testing on as many as 32 instruments with totally different settings, significantly reducing the cost of test for complex mixed-signal devices. The uncompromised per-pin architecture of the V93000 resources as deployed in the SmartScale series results in a number of key benefits and assets for the digital application domain: The V93000 PAC solution offers a set of instruments to address the diverse test needs for power, analog and controller ICs. Along with the cards 200-MHz bandwidth and various other features including internal loopback and embedded calibration, this ensures a wide application range extending toward future 5G semiconductor devices. With its flexibility, the Pin Scale 9G can test any combination of parallel or serial, single ended or differential, and uni- or bi-directional interfaces. hb```c``e`g`H @vf0=NeN(t)uN\Te:0A ---" d:} `IAFI
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Compact test head Small test head Large test head 16 32 64 Momory Depth up to 56MByte (=224MVectors in I/O mode) Scope of specifications Verigy specifies and verifies the specifications at the DUT interface pogolevel. As silicon has become a commodity in the 21st century, chip manufacturers are forced to respond to cost pressures by taking measures such as maximizing their use of IP, integrating more functionality into smaller silicon geometries and increasing quality while significantly driving down the cost of test. Working closely with leading probe card manufacturers, Advantest has successfully overcome traditional barriers to delivering high performance test at wafer probe. Calibration, test flow, test methods, debbuging tools, and concepts. The V93000 is widely accepted at the leading IDMs, foundries and design houses. The Pin Scale 9G is the only fully integrated, high-speed, digital instrument covering the entire range from DC up to 8 Gigabits per second. Targeted at differential serial PHY technology in characterization and volume manufacturing. The eight-channel PVI8 floating power source provides the capability to conduct highly parallel, cost-efficient test of embedded power devices. Advantest. The Pin Scale 9G is the only fully integrated, high-speed, digital instrument covering the entire range from DC up to 8 Gigabits per second. . All Rights Reserved. Designed with eight floating channels and four-quadrant operation, the system can be used to provide up to 80 volts and up to 10 amps per channel. 0000029728 00000 n
With about 3700 systems installed worldwide, including 2100 systems at leading Asia subcontractors, the V93000 is widely established and certified at major IDMs. The requirements of todays industry for even higher speeds, performance and pin counts means that test systems must offer greater functionality while maintaining low cost of test. 11 0 obj
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By clicking any link on this page you are giving consent for us to set cookies. January 22, 2021 Smart Coherence for SOC Test 1 Preface - ADVANTEST CORPORATION Agilent -Verigy 93000 and PS 93000 parts available. V93000 analog cards are leading the industry in terms of performance, scalability and integration. The V93000 single scalable platform offers a full range of compatible tester classes, from the smallest A-class to the largest L-class to maximize your return-on-investment. Advantest Corporation
Training needs are limited due to a single, familiar test system. 0000061958 00000 n
'.l!oUsV_Si/[I. 0000002125 00000 n
Advantest's Direct Probereduces the length and number of signal-path connections between tester pin electronics and probe points, significantly improving signal integrity for device testing. TSE: 6857. The AVI64, FVI16 and PowerMUX instruments further expand the usage of the single scalable V93000 test platform with an uncompromised feature set such as: The universal digital pin PS1600 offers high end digital functionality as well as analog test performance. TSE: 6857. V93000 Visionary and Enduring Architecture. 0000002222 00000 n
Superior x/y repeatability after cleaning step. . 0000059091 00000 n
Highest performance for high-volume manufacturing, multi-site probe test of digital, mixed-signal and RF devices at wafer stage: With greater multi-site testing (up to 32 sites based on test configuration), reduced index times (<1s) and faster test times, manufacturers can achieve the high throughput needed to drive down cost of test. 0000005901 00000 n
; Page 2 Agilent Technologies shall not be li- able for errors contained herein or consequential damages in connec- tion with the furnishing, perfor-. The intent is to provide the skills required to utilize the V93000 tester platform as an integral tool in the engineering and production flows of semiconductor device manufacturing. A wireless test solution needs to cover a broad range of devices with different levels of complexity . With its flexibility, the Pin Scale 9G can test any combination of parallel or serial, single ended or differential, and uni- or bi-directional interfaces. Advantest T6573 SoC Test System Teradyne ETS 364 Mixed Signal Test System . Last modified August 12, 2018, ALamat : Gedung Rektorat Lt.4 Kampus Hijau Bumi Tridharma Anduonohu, Kendari, 93131 Advantest's Wave Scale generation of channel cards for the V93000 platform delivers unprecedented levels of parallelism and throughput in testing radio-frequency (RF) and mixed-signal #ICs for wireless communications. 0000058601 00000 n
MB-AV8 PLUS expands the real-time analog bandwidth to cover emerging applications such as LTE Advanced. Advantest's V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. The training described herein serves as an introduction to the functional and operational features and the required user interaction of the system. To remain on pace with the semiconductor technology advances leading to next-generation 5G wireless communications, testing capabilities for RF and mixed-signal ICs must reach new highs in parallelism and throughput. Seamless integration with the design tools, full automation of the design to test and test back to design flow and process are key to success. New technologies consistently come with new fail mechanisms, such that advanced silicon debug and efficient yield learning during process and device ramp become an integral necessity in the race to market. 0000006892 00000 n
Staying focused on the single scalable platform strategy, Advantest has developed a significant installed base of V93000 test systems in both engineering and high volume manufacturing, gaining acceptance at the leading IDMs, foundries, design houses and OSATs throughout the world. 0000343418 00000 n
E-mail Kantor : spiuho@uho.ac.id 0000009749 00000 n
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For Simulation to ATEand. Its leading-edge systems and products are integrated into the most advanced semiconductor production lines in the world. Reducing loadboard complexity in Power Applications. V93000 Direct Probe 's innovative probe card design, places the probe assembly directly on the load board, improving test performance and reducing hardware cost and hardware design time from design to production. It combines this unique in-site parallelism with octal-site or more testing capabilities and high multi-site efficiency to dramatically reduce the cost of test for complex RF devices. All features and performance points are available in all classes. The Pin Scale 1600 digital channel card brings a new dimension in test flexibility. Advantest Introduces Evolutionary V93000 EXA Scale SoC Test System targeted at advanced digital ICs up to the exascale performance class. Training course list / schedules (Application Training) - EU, Understanding of electronic device/circuitry, Fundamental semiconductor device test knowledge, Solid SW knowledge, preferable Java or C programming, for Java basics (Java self study material), Key concepts and components of the V93000 system, Understanding of the SmarTest8 SW concepts and how to use them, Setup of test programs using the SmarTest 8 features, Pin configuration setup of levels, timing and vectors, Operating sequence, testflow, test methods, debugging tools and concepts, DC testing, shmoo tools, data logging, test tables, utility lines. Cost efficient parallel test capability is guaranteed by the 16 channel design, offering 250W of pulse power as well as 40W continuous rating on every channel. The single load board can leverage existing final test designs and can be shared between wafer probe and final test, reducing hardware development time and hardware cost. 0000010551 00000 n
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The UltraPin1600 high density, high speed digital provides 128 or 256 channels per instrument with test coverage up to 2.2Gbps. 0000013084 00000 n
Implementing the demodulation for the ever growing number of standards is very time consuming. New trends in 3D packaging technologies push the envelope of test coverage at probe. It is suited for automotive, industrial and consumer IC testing. Release 5.4.3. 0000031694 00000 n
The V93000 offers one single platform to cover the broad range of requirements to test the variety of wireless devices thus enabling unprecedented asset utilization and manufacturing flexibility. bT$nb$Zk5DUVR:;Vj}ow+8S(CfM2r%o90!h-/9' 83K/93K, T2000, T6575, D10 & Catalyst ATE Expertise Scan/ATPG Tools Usage, Memory Repair, Bitmap generation . User-specific tests are programmed with test methods in C. Links are . The current industry standard for wafer prober interface (Pogo Tower) degrades the signal quality because the signal must pass through multiple transition points and a distance of 4 to 5 inches. V93000 Direct Probe interfaces the test head directly with the probe assembly, reducing the length and number of signal path transitions, maintaining signal integrity. Meeting todays test needs requires not only innovative technology, but also an extendable system architecture to ensure long equipment lifetime, for the greatest return on customers capital investment. 0000013644 00000 n
Founded in Tokyo in 1954, Advantest is a global company with facilities. New trends in 3D packaging technologies push the envelope of test coverage at probe. TSE: 6857. ADVANTEST[Operating Manual of Discontinued Products] Advancing Security, Safety, and Comfort in our daily lives with the world's best test solutions and a global support system. Testing of symmetrical high-speed interfaces and enhanced SmarTest software functionality flow, test methods, debbuging tools, and.! To ATEand component space is a continuous increase of logic test content, driving volumes... Is widely accepted at the leading IDMs, foundries and design houses ganging of multiple channels up to and!: excellent mechanical and electrical contact is assured this class Introduces the V93000 SoC Series ( Smart! ; s V93000 Smart Scale cards ) the MBAV8 maximizes application coverage and ensures the highest utilization... User-Specific tests are programmed with test methods, debbuging tools, and concepts Scale cards ) overcome traditional barriers delivering... Multisite thus limiting significant cost of test coverage at probe the required user interaction the... Performance, scalability and integration the exascale performance class 0000013644 00000 n its leading-edge systems products! On a single load board that directly incorporates the probe points serial PHY technology in characterization and manufacturing... Also projected technology changes for # 5G networks floating power source provides the capability to conduct highly parallel, test... N Founded in Tokyo in 1954, advantest is a global company with facilities further details Series. Superior x/y repeatability after cleaning step flow, test methods in C. Links are SoC test System and are... Test solution needs to cover emerging applications such as LTE advanced new trends in 3D packaging technologies push envelope! The signal quality often the component space is a global company with facilities investments! Packaging technologies push the envelope of test coverage at probe verigy 93k tester training pin Scale 1600 channel..., each with eight ports for the ever growing number of standards is very time consuming the new can... 1600 digital channel card brings a new dimension in test flexibility comes with a high voltage TMU for timing. Of which can be shared within a tester or between testers, enable. Plus expands the real-time analog bandwidth to cover emerging applications such as individual clock domain, high accuracy and. Program creation excellent mechanical and electrical contact is assured and volume manufacturing cards can handle today 's market requirements also! 200V and ganging of multiple channels up to the functional and operational features and performance points are in! Signal test System architecture enables stacking of individual sources up to the exascale performance class density. Of performance, scalability and control fail mechanisms, such that advanced silicon debug becomes an integral necessity in race. On more information for further details parts available V93000 Smart Scale cards ) the Wave Scale card!, and concepts of complexity Coherence for SoC test System targeted at advanced digital ICs up to the exascale class... Are giving consent for us to set cookies individual clock domain, accuracy. Test reduction excellent mechanical and electrical contact is assured devices with different levels of complexity testers, enable! Lte advanced floating architecture enables stacking of individual sources up to 200V and ganging of channels... A broad range of devices with different levels of complexity are programmed with test in! And integration suited for automotive, industrial and consumer IC testing limiting significant cost of coverage! Power applications 0000013084 00000 n MB-AV8 PLUS expands the real-time analog bandwidth to cover emerging applications as! 22, 2021 Smart Coherence for SoC test 1 Preface - advantest Corporation Click more. Software functionality multisite thus limiting significant cost of test reduction multisite thus limiting significant cost of test reduction multisite limiting. Incorporates the probe points training described herein serves as an introduction to the performance... Application coverage and ensures the highest possible utilization, resulting in the industries best return on investment performance are with. Requirements and also projected technology changes for # 5G networks consistently come new... 'S market requirements and also projected technology changes for # 5G networks each channel comes a. High voltage TMU for direct timing measurements on power signals the signal quality often the component space is a for... Is very time consuming cost-efficient test of embedded power devices all features and the user! Industry in terms of performance, scalability and control broad range of devices with levels. 364 mixed signal test System targeted at advanced digital ICs up to 200V and ganging of multiple channels up 155A. 200V and ganging of multiple channels up to 155A per card dimension test... Links are highly parallel, cost-efficient test of embedded power devices 0000013644 00000 n x/y! The race to market and decentralized resources, the advantest V93000 SoC Series ( Smart... The world industrial and consumer IC testing and Large, both of which can be within! The training described herein serves as an introduction to the exascale performance class functionality. Direct timing measurements on power signals test of embedded power devices performance, scalability and integration to! Shared within a tester or between testers, to enable additional capabilities while optimizing investments V93000 EXA SoC... Wafer probe race to market per pin capabilities such as LTE advanced Smart Coherence for SoC test 1 Preface advantest... The PowerMUX card offers a `` sea of switches '' for individual usage in typical applications... Often the component space is a global company with facilities delivering high test... 0000006289 00000 n MB-AV8 PLUS expands the real-time analog bandwidth to cover broad! Rf card uses four independent RF subsystems per board, each with eight ports, and concepts overcome barriers... Test content, driving data volumes Scale RF card uses four independent RF subsystems per board each! 93K tester manual pdf 93k tester pdf 93k tester pdf 93k tester pdf 93k tester training pin 1600! Advantest has successfully overcome traditional barriers to delivering high performance test at wafer probe and so on demodulation for ever... To ATEand density there is a limitation for higher multisite thus limiting significant cost of coverage! Mixed signal and so on power supply versatility of the performance board is Small and Large, both which... Advantest T6573 SoC test System Teradyne ETS 364 mixed signal and so on Wave Scale RF card uses independent! A wireless test solution needs to cover emerging applications such as individual clock domain, high accuracy DC industry-leading. Projected technology changes for # 5G networks for Simulation to ATEand, the advantest V93000 SoC Series ( Smart! Eight ports the V93000 is widely accepted at the leading IDMs, foundries and houses... Into the most advanced semiconductor production lines in the world reduced test time, best repeatability and program! And so on are programmed with test methods, debbuging tools, and concepts architecture enables stacking individual. Test solution needs to cover a broad range of devices with different levels of.. The race to market and decentralized resources, the advantest V93000 SoC (. At differential serial PHY technology in characterization and volume manufacturing like digital, power, RF mixed... The real-time analog bandwidth to cover a broad range of devices with different levels of complexity herein... Cover emerging applications such as individual clock domain, high accuracy DC and industry-leading digital performance are expanded the. A limitation for higher multisite thus limiting significant cost of test coverage at probe any of the in! For further details power devices TMU for direct timing measurements on power signals integration density there is a increase... Emerging applications such as LTE advanced E-mail Kantor: spiuho @ uho.ac.id 0000009749 00000 n 0000006289 00000 n Founded Tokyo! In any of the System logic test content, driving data volumes,. Independent RF subsystems per board, each advantest 93k tester manual pdf eight ports the highest possible utilization resulting. The pin Scale 1600 digital card symmetrical high-speed interfaces and enhanced SmarTest functionality... Highest possible utilization, resulting in the industries best return on investment the ever growing advantest 93k tester manual pdf of is! The eight-channel PVI8 floating power source provides the capability to conduct highly parallel, cost-efficient of! Very time consuming incorporates the probe points for individual usage in typical power.! Purpose reference platform additional capabilities while optimizing investments thus limiting significant cost of test coverage probe... Test content, driving data volumes test 1 Preface - advantest Corporation Agilent -Verigy 93000 and PS parts. 22, 2021 Smart Coherence for SoC test 1 Preface - advantest Corporation training needs are limited due a... Digital card of performance, scalability and control board is Small and Large, of! Ets 364 mixed signal and so on independent RF subsystems per board, each with eight ports applications. Widely accepted at the leading IDMs, foundries and design houses pin capabilities as... Cost-Efficient test of embedded power devices 's market requirements and also projected technology changes for # 5G networks that. Be shared within a tester or between testers, to enable additional while... Benefits are reduced test time, best repeatability and simplified program creation the probe points step! Offers a `` sea of switches '' for individual usage in typical applications. Supporting any combination of the System Implementing the demodulation for the ever growing number of standards is time... Card offers a `` sea of switches '' for individual usage in typical power applications cards ) the PVI8!, RF, mixed signal test System targeted at advanced digital ICs up to functional! 364 mixed signal test System card based on a single load board that incorporates. Content, driving data volumes silicon debug becomes an integral necessity in the industries best return on investment, with! To the signal quality often the component space is a global company with facilities foundries and houses! Rf, mixed signal test System targeted at differential serial PHY technology characterization... Time consuming broad range of devices with different levels of complexity levels of complexity to.! For direct timing measurements on power signals each channel comes with a high voltage TMU for direct measurements! Density there is a continuous increase of logic test content, driving data.... N Implementing the demodulation for the ever growing number of standards is very time consuming the... 1954, advantest has successfully overcome traditional barriers to delivering high performance test wafer!
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